A Comprehensive Solution for Optimizing Semiconductor Test
Pintail’s products are organized under two major product lines illustrated below: SwifTest™ and TestScape®.
SwifTest is a family of on-line, adaptive test modules that typically run directly on the ATE and capture and analyze data in real-time. On-line decision making is performed using algorithms based upon advanced statistical analysis techniques. Capabilities include:
- Test time optimization
- Quality and reliability improvement
- On-line monitoring and monitoring actions
- Dynamic adaptive test improvements
- An optional interface to your test cell controller
TestScape is an powerful database system that accepts data in real-time from SwifTest and supports various data management applications faster than traditional post processing database systems.
- TestScape-Aware provides a common dashboard for test results across multiple brands of testers and multiple test floors or subcons for rapid issue identification and resolution.
- TestScape-SPC performs on-line statistical monitoring looking for device-specific excursions or trends that might negatively impact quality or throughput.
- TestScape-OPS is used for on-line management of your test floor and supports real-time OEE and life cycle management functions.
- TestScape-Charzilla performs comprehensive device characterization including final report generation.
- TestScape is not required for most on-line adaptive test procedures performed by SwifTest, but is required for feed-forward or feedback adaptive test applications.
Users perform off-line data analysis using a variety of tools. Pintail’s TestVision/6 is typically used for this analysis in order to prepare adaptive test strategies and to simulate the expected results. While STDF is frequently used as the input format, SwifTest can accept many forms of test data. We do not require you to change your corporate data base or data logging procedures, as SwifTest overlays transparently on whatever infrastructure you already have in place.
Note that one output of the TestVision/6 is the Pintail Device Profile. For each device using Pintail’s adaptive test, a Device Profile exists that carries certain variables defined by the user that control the adaptive test processing for that specific device.
- SwifTest™
- The industry’s most trusted real-time monitoring platform
- Transparent to tester operations and performance
- Supports wide range of adaptive test procedures
- Extensive production history of reducing test cost, improving reliability and accelerating yield ramp
- TestScape™
- Real-time visibility to test results and test floor operations
- Real-time statistical process control for semiconductor test
- Common dashboard across heterogeneous testers and test floors
- Saves time and improves productivity and efficiency
- Easy to use, easy to deploy, easy to own
Client Resources
Login Required
Click here to login now.
- 20 - 45% reduction in test time
- 25 - 80% improvement in throughput
- Reduced defects
- Improved operational efficiency
Find out how Qualcomm used Pintail Technologies’ SwifTest-AMX™ and SwifTest-TTO™ to significantly reduce cost of test and increase margins.
Click Here >>
