Real-time, Statistical Process Control for Semiconductor Test
TestScape-SPC is an optional module in the TestScape family that performs real-time statistical process control monitoring per device-specific recipes to guarantee consistent quality over the entire test process from wafer probe to final test. TestScape is a versatile, web-based analytics suite that works in concert with SwifTest-Monitor to deliver real-time information, remote process control, and decision support from anywhere in the world. Real-time data in test operations means that issues are identified earlier, quality is assured, and throughput is maximized.
- Early warning system detects process variations during testing
- Systematic way of insuring ultra-high quality of test results
- Helps improve test yield and throughput
- Real-time monitoring of device-specific statistical controls
- User configurable controls
- Comprehensive event disposition and management reporting
- Drives process improvement to be consistent and predictable
- A visual tool for ongoing control of a process
- Differentiates causes of variation
- Supports leading brands of testers including proprietary testers
- Configurable for device-by-device, mid-lot or end-of-lot monitoring
- Multi-site monitoring and alerts
- A common language for managing process performance
- Easy to deploy, easy to learn and easy to use
User configurable Controls
A variety of statistical controls can be selected by the user and assigned to specific devices of interest. Controls can be simple monitoring of bin or test limits, or can be complex algorithms like WECO trend rules (some examples illustrated above) or customer defined algorithms.
Comprehensive Event Disposition Subsystem
When events are triggered, the system guides the user through the classification, analysis and final resolution of the issue. Events may also be delegated to additional personnel for final closure.
Performance Management
As events are closed graphical reports are easily displayed showing Pareto charts of reason codes and disposition codes. Trends in event frequency and closure provide management with clear summaries of team responsiveness and process stability.
Visibility across the Supply Chain
TestScape-SPC provides a common view of multiple test floors around the world, including outsourced test subcontractors that your company may use. Today, Pintail software is monitoring nearly 1000 testers worldwide.
Highly Scalable and Portable
Pintail’s software modules enable user to deploy solutions on a tester by tester, or floor by floor basis. We support all major ATE brands as well as your proprietary testers. You can start small and grow as your requirements increase.
Other TestScape modules that may be integrated with SPC include TestScape-AWARE for complete on-line data analysis and yield learning, and TestScape-OPS for real-time OEE and test floor management.
To learn more about TestScape-SPC and how it can help your company meet the highest quality standards in the industry, contact Pintail for an on-line demonstration today.
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“Our engagement with Pintail is another example of Melexis’ commitment to investing in new infrastructure for maximizing the quality and reliability of our products.”
Françoise Chombar
CEO of Melexis
