Powerful analysis tools with point & click ease of use
Pintail offers you a powerful suite of test data analysis tools to help you understand your test processes and to formulate corrective strategies. Ease of use and rapid issue identification of issues are key features designed into all Pintail tools.
Off-line, Desktop Analysis
Pintail offers two products that run on your desktop PC and access data via STDF files.
TestVision/6® is used to analyze historical test logs to determine the optimum test time reduction plan for use with SwifTest-TTO, or to determine the optimum outlier detection plan for use by SwifTest-FOX. TestVision/6 includes a versatile data browser that displays the results of each test over time so that the user can visualize what is happening during sampling or outlier extraction. TestVision/6 is provided to Pintail customer for no charge.
reduTec is the premier redundancy analysis tool from our friends at optimiSE. The reduTec product combines a variety of sophisticated mathematical models to determine the best test plan, based on correlations among individual tests and between a test and a group of tests. The product can also detect complex levels of redundancy within the test program.
On-Line, Web-based Analysis
TestScape-AWARE™ is a web-based application that uses Oracle™ to store and organize test results. Users access it with any modern web browser. TestScape is normally configured as an on-line, near-real-time system collecting data from your testers via Pintail’s SwifTest-Monitor. It can also be configured as an economical, easy-to-use dashboard to analyze your off-line STDF data logs with point & click ease.
TestScape is a completely scalable system useful to very small organizations as well as the giant test floors of IDMs and test subcons. It is distinguished by its speed and point & click ease of finding issues in your data, your test equipment or test operations. Users report that with a couple clicks of the mouse, they can identify issues that would normally require a day of time using traditional off-line tools.
- TestScape-AWARE
- Accelerates yield learning and new product introduction
- Web-based DBMS with point and click ease of use
- Ultra-fast on-line monitoring of your test data
- Dashboard for monitoring heterogeneous ATEs with common metrics
- Monitor multiple test floors including your subcons
- TestVision/6
- Off-line analysis to historical data logs to determine optimum plan for test time reduction or outlier extraction
- Simulates capabilities for SwifTest-TTO and SwifTest-FOX
- Provides graphical view of test results over time
- reduTec
- Correlation and redundancy analysis across tests and groups of tests
- Very flexible data input and manipulation by the user
- Supports parametric and digital test data
The analysis of test data is critical to the process of semiconductor manufacturing and even more so when bringing up new silicon designs. Achieving yield entitlement is an iterative process and the early and timely analysis of test data is an obvious advantage to any organization. TestScape is the first real-time DBMS on the market designed specifically for test and product engineers.
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"The biggest surprise has been the SPEED. It is very fast at pinpointing specific issues across a vast amount of data. Being able to see your worldwide production in real-time from anywhere on the Internet is an awesome feeling."
Andrew Bruno
Director of Test Engineering
Power Integrations, Inc
www.powerint.com
